Scanning Electron Microscopy with Energy Dispersive X-ray Spectroscopy (SEM/EDX) is a combined analytical technique that provides both high-resolution imaging and elemental composition analysis of materials.

In SEM, a focused electron beam scans the surface of a sample, producing detailed images that reveal its topography, morphology, and microstructure at magnifications far beyond optical microscopes. When combined with EDX, the interaction of the electron beam with the sample generates characteristic X-rays that are used to identify and quantify the elements present.

This dual capability makes SEM/EDX especially powerful for understanding both the structure and chemistry of materials in a single experiment. It is widely used in materials science, metallurgy, geology, semiconductors, pharmaceuticals, and forensic investigations. By offering precise imaging alongside rapid elemental analysis, SEM/EDX is an essential tool for research, quality control, and failure analysis.