Total Reflection X-Ray Fluorescence (TXRF) is a specialized form of XRF designed for ultra-trace elemental analysis. Unlike conventional XRF, TXRF uses a very shallow angle of incidence for the primary X-ray beam, which minimizes background noise and enhances sensitivity. This allows detection of elements down to parts-per-billion (ppb) levels with high accuracy.

TXRF requires only a tiny amount of sample—often just a drop of solution or a thin layer of solid—making it especially useful when material is limited. It is widely used in environmental monitoring (water and soil testing), semiconductor and thin-film analysis, pharmaceuticals, food safety, and biological research. Because it is fast, non-destructive, and requires minimal sample preparation, TXRF is an excellent tool for routine ultra-trace elemental detection and quality control.