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Key Features:
• Simplified, mid-range ICP-MS optimized for routine trace element analysis
• He-mode collision cell technology (ORS4) providing effective polyatomic interference removal
• Wide linear dynamic range (up to 9 orders of magnitude) for trace-to-major elements
• Intelligent software with pre-set methods and auto-optimization for rapid startup
• Reduced argon gas consumption for cost-efficient operation
• Integrated with ICP Go software tools for easy method setup and operator training
• Compliance-ready with 21 CFR Part 11 support via Agilent MassHunter -
Applications:
• Environmental testing of water and soil for heavy metals and contaminants
• Food and beverage analysis for nutritional elements and toxic metals
• Clinical and toxicology research for trace element biomonitoring
• Pharmaceutical quality control for ICH Q3D and USP <232>/<233> elemental impurity guidelines
• Industrial and semiconductor sectors for trace metal contamination testing -
Specifications:
Specification Details ICP-MS Platform Agilent 7850 Quadrupole ICP-MS MS System Type Single Quadrupole Ionization Source Inductively Coupled Plasma (ICP) Collision/Reaction Cell ORS4 Collision Cell with helium mode Sensitivity >1 Mcps/ppb (⁷Li) Background Noise <0.1 counts per second Detection Limits ppt (parts per trillion) level Dynamic Range Up to 9 orders of magnitude Autosampler Compatible with Agilent ASX series autosamplers Interface Ni sample/cones (Pt optional for aggressive matrices) Software Agilent ICP-MS MassHunter + ICP Go software Compliance 21 CFR Part 11 support 🔷 These auto-samplers are optional add-ons, available on customer demand with the Agilent 7850 ICP-MS system.
Agilent SPS 4 Autosampler
A high-capacity autosampler featuring a robust gantry frame, supporting up to 360 vial positions or 768 microtiter wells. Delivers precise, corrosion-resistant, and compact sample handling—perfect for high-throughput ICP-MS workflows.
Agilent Integrated Autosampler (I-AS)
A contamination-free, covered autosampler designed for ultratrace and semiconductor applications. It includes a metal-free probe, continuous rinse stream, corrosion- and HF-resistant construction, and flexible rack layouts—ideal for trace-level ICP-MS analyses.